Rawad N. Al-Haddad, Rashad S. Oreifej, Ramtin Zand, Abdel Ejnioui, Ronald F. DeMara. Adaptive Mitigation of Radiation-Induced Errors and TDDB in Reconfigurable Logic Fabrics. In 24th IEEE North Atlantic Test Workshop, NATW 2015, Johnson City, NY, USA, May 11-13, 2015. pages 23-32, IEEE, 2015. [doi]
@inproceedings{Al-HaddadOZED15,
title = {Adaptive Mitigation of Radiation-Induced Errors and TDDB in Reconfigurable Logic Fabrics},
author = {Rawad N. Al-Haddad and Rashad S. Oreifej and Ramtin Zand and Abdel Ejnioui and Ronald F. DeMara},
year = {2015},
doi = {10.1109/NATW.2015.14},
url = {http://dx.doi.org/10.1109/NATW.2015.14},
researchr = {https://researchr.org/publication/Al-HaddadOZED15},
cites = {0},
citedby = {0},
pages = {23-32},
booktitle = {24th IEEE North Atlantic Test Workshop, NATW 2015, Johnson City, NY, USA, May 11-13, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7417-0},
}