Rawad N. Al-Haddad, Rashad S. Oreifej, Ramtin Zand, Abdel Ejnioui, Ronald F. DeMara. Adaptive Mitigation of Radiation-Induced Errors and TDDB in Reconfigurable Logic Fabrics. In 24th IEEE North Atlantic Test Workshop, NATW 2015, Johnson City, NY, USA, May 11-13, 2015. pages 23-32, IEEE, 2015. [doi]
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