Jannah Al-Hashimi, Seepsa Tomoq, Khaldoon Abugharbieh, Yazan Al-Qudah, Mustafa Shihadeh. An SRAM based testing methodology for yield analysis of semiconductor ICs. In 20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013. pages 417-420, IEEE, 2013. [doi]
Abstract is missing.