Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton. From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry. In 2021 European Control Conference, ECC 2021, Virtual Event / Delft, The Netherlands, June 29 - July 2, 2021. pages 1768-1773, IEEE, 2021. [doi]
Abstract is missing.