Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton. Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry. In 60th IEEE Conference on Decision and Control, CDC 2021, Austin, TX, USA, December 14-17, 2021. pages 1356-1362, IEEE, 2021. [doi]
Abstract is missing.