Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuck. Segmented Addressable Scan Architecture. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 405-411, IEEE Computer Society, 2005. [doi]
@inproceedings{Al-YamaniCG05,
title = {Segmented Addressable Scan Architecture},
author = {Ahmad A. Al-Yamani and Erik Chmelar and Mikhail Grinchuck},
year = {2005},
doi = {10.1109/VTS.2005.74},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.74},
tags = {architecture},
researchr = {https://researchr.org/publication/Al-YamaniCG05},
cites = {0},
citedby = {0},
pages = {405-411},
booktitle = {23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2314-5},
}