Mashael Al-luhaybi, Stephen Swift, Steve Counsell, Allan Tucker. Exploring the Explicit Modelling of Bias in Machine Learning Classifiers: A Deep Multi-label ConvNet Approach. In M. Arif Wani, Mehmed M. Kantardzic, Vasile Palade, Daniel Neagu, Longzhi Yang, Kit Yan Chan, editors, 21st IEEE International Conference on Machine Learning and Applications, ICMLA 2022, Nassau, Bahamas, December 12-14, 2022. pages 1799-1806, IEEE, 2022. [doi]
Abstract is missing.