The impact of process-induced mechanical stress in narrow width devices and variable-taper CMOS buffer design

Naushad Alam, Bulusu Anand, Sudeb Dasgupta. The impact of process-induced mechanical stress in narrow width devices and variable-taper CMOS buffer design. Microelectronics Reliability, 53(5):718-724, 2013. [doi]

Abstract

Abstract is missing.