Assessing software reliability performance under highly critical but infrequent event occurrences

M. S. Alam, W. H. Chen, Willa K. Ehrlich, M. E. Engel, D. A. Kropfl, P. Verma. Assessing software reliability performance under highly critical but infrequent event occurrences. In Eighth International Symposium on Software Reliability Engineering, ISSRE 1997, Albuquerque, NM, USA, November 2-5, 1997. pages 294-307, IEEE Computer Society, 1997. [doi]

Authors

M. S. Alam

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W. H. Chen

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Willa K. Ehrlich

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M. E. Engel

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D. A. Kropfl

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P. Verma

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