M. S. Alam, W. H. Chen, Willa K. Ehrlich, M. E. Engel, D. A. Kropfl, P. Verma. Assessing software reliability performance under highly critical but infrequent event occurrences. In Eighth International Symposium on Software Reliability Engineering, ISSRE 1997, Albuquerque, NM, USA, November 2-5, 1997. pages 294-307, IEEE Computer Society, 1997. [doi]
@inproceedings{AlamCEEKV97,
title = {Assessing software reliability performance under highly critical but infrequent event occurrences},
author = {M. S. Alam and W. H. Chen and Willa K. Ehrlich and M. E. Engel and D. A. Kropfl and P. Verma},
year = {1997},
doi = {10.1109/ISSRE.1997.630878},
url = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.1997.630878},
researchr = {https://researchr.org/publication/AlamCEEKV97},
cites = {0},
citedby = {0},
pages = {294-307},
booktitle = {Eighth International Symposium on Software Reliability Engineering, ISSRE 1997, Albuquerque, NM, USA, November 2-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-8186-8120-9},
}