Md. Hasibul Alam, Iftikhar Ahmad Niaz, Imtiaz Ahmed, Zubair Al Azim, Nadim Chowdhury, Quazi Deen Mohd Khosru. InxGa1-xSb MOSFET: Performance analysis by self consistent CV characterization and direct tunneling gate leakage current. In 2012 IEEE International Conference on Electro/Information Technology, Indianapolis, IN, USA, May 6-8, 2012. pages 1-6, IEEE, 2012. [doi]
Abstract is missing.