Arbab Alamgir, Abu Khari bin A'Ain, Norlina Paraman, Usman Ullah Sheikh, Ian Andrew Grout. Horizontal diversity in test generation for high fault coverage. Turkish J. Electr. Eng. Comput. Sci., 26(6):3259-3274, 2018. [doi]
No references recorded for this publication.
No citations of this publication recorded.