Horizontal diversity in test generation for high fault coverage

Arbab Alamgir, Abu Khari bin A'Ain, Norlina Paraman, Usman Ullah Sheikh, Ian Andrew Grout. Horizontal diversity in test generation for high fault coverage. Turkish J. Electr. Eng. Comput. Sci., 26(6):3259-3274, 2018. [doi]

Abstract

Abstract is missing.