Revival of partial scan: Test cube analysis driven conversion of flip-flops

Nader Alawadhi, Ozgur Sinanoglu. Revival of partial scan: Test cube analysis driven conversion of flip-flops. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 260-265, IEEE Computer Society, 2011. [doi]

Authors

Nader Alawadhi

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Ozgur Sinanoglu

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