Alan Albee. A practical guide to combining ICT & boundary scan testing. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 487-494, IEEE Computer Society, 2001.
@inproceedings{Albee01,
title = {A practical guide to combining ICT & boundary scan testing},
author = {Alan Albee},
year = {2001},
tags = {testing},
researchr = {https://researchr.org/publication/Albee01},
cites = {0},
citedby = {0},
pages = {487-494},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}