Miriam Alber, Christoph Hönes, Patrick Baier. Evaluating Vision Transformer Models for Visual Quality Control in Industrial Manufacturing. In Albert Bifet, Tomas Krilavicius, Ioanna Miliou, Slawomir Nowaczyk, editors, Machine Learning and Knowledge Discovery in Databases. Applied Data Science Track - European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9-13, 2024, Proceedings, Part X. Volume 14950 of Lecture Notes in Computer Science, pages 116-132, Springer, 2024. [doi]
Abstract is missing.