Effect of thermal and electrical stress on photometric, radiometric, and colorimetric characteristics of large area white organic light emitting diodes

Alaa Alchaddoud, Laurent Canale, Jamal Rammal, Georges Zissis. Effect of thermal and electrical stress on photometric, radiometric, and colorimetric characteristics of large area white organic light emitting diodes. In IEEE Industry Applications Society Annual Meeting, IAS 2018, Portland, OR, USA, September 23-27, 2018. pages 1-5, IEEE, 2018. [doi]

Abstract

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