Ahmed Aldabbagh, Alistair Duffy. Ageing effects on power RF LDMOS reliability using the Transmission Line Matrix method. In 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015, Edinburgh, UK, November 10-13, 2015. pages 157-162, IEEE, 2015. [doi]
@inproceedings{AldabbaghD15,
title = {Ageing effects on power RF LDMOS reliability using the Transmission Line Matrix method},
author = {Ahmed Aldabbagh and Alistair Duffy},
year = {2015},
doi = {10.1109/EMCCompo.2015.7358349},
url = {https://doi.org/10.1109/EMCCompo.2015.7358349},
researchr = {https://researchr.org/publication/AldabbaghD15},
cites = {0},
citedby = {0},
pages = {157-162},
booktitle = {10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015, Edinburgh, UK, November 10-13, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7897-0},
}