Local Difference of Gaussian Binary Pattern: Robust Features for Face Sketch Recognition - researchr publication authors

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Ann Theja Alex, Vijayan K. Asari, Alex Mathew. Local Difference of Gaussian Binary Pattern: Robust Features for Face Sketch Recognition. In IEEE International Conference on Systems, Man, and Cybernetics, Manchester, SMC 2013, United Kingdom, October 13-16, 2013. pages 1211-1216, IEEE, 2013. [doi]

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