Local Difference of Gaussian Binary Pattern: Robust Features for Face Sketch Recognition

Ann Theja Alex, Vijayan K. Asari, Alex Mathew. Local Difference of Gaussian Binary Pattern: Robust Features for Face Sketch Recognition. In IEEE International Conference on Systems, Man, and Cybernetics, Manchester, SMC 2013, United Kingdom, October 13-16, 2013. pages 1211-1216, IEEE, 2013. [doi]

@inproceedings{AlexAM13,
  title = {Local Difference of Gaussian Binary Pattern: Robust Features for Face Sketch Recognition},
  author = {Ann Theja Alex and Vijayan K. Asari and Alex Mathew},
  year = {2013},
  doi = {10.1109/SMC.2013.210},
  url = {http://dx.doi.org/10.1109/SMC.2013.210},
  researchr = {https://researchr.org/publication/AlexAM13},
  cites = {0},
  citedby = {0},
  pages = {1211-1216},
  booktitle = {IEEE International Conference on Systems, Man, and Cybernetics, Manchester, SMC 2013, United Kingdom, October 13-16, 2013},
  publisher = {IEEE},
}