New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs - researchr publication authors

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Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis. New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 99-107, IEEE Computer Society, 2002. [doi]

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