Fault injection and fault tolerance methodologies for assessing device robustness and mitigating against ionizing radiation - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Dan Alexandrescu, Luca Sterpone, Celia López-Ongil. Fault injection and fault tolerance methodologies for assessing device robustness and mitigating against ionizing radiation. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-6, IEEE, 2014. [doi]

This author has not been identified. Look up 'Dan Alexandrescu' in GoogleThis author has not been identified. Look up 'Luca Sterpone' in GoogleThis author has not been identified. Look up 'Celia López-Ongil' in Google

runs on WebDSL