Dan Alexandrescu, Luca Sterpone, Celia López-Ongil. Fault injection and fault tolerance methodologies for assessing device robustness and mitigating against ionizing radiation. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{AlexandrescuSL14,
title = {Fault injection and fault tolerance methodologies for assessing device robustness and mitigating against ionizing radiation},
author = {Dan Alexandrescu and Luca Sterpone and Celia López-Ongil},
year = {2014},
doi = {10.1109/ETS.2014.6847812},
url = {http://dx.doi.org/10.1109/ETS.2014.6847812},
researchr = {https://researchr.org/publication/AlexandrescuSL14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014},
editor = {Giorgio Di Natale},
publisher = {IEEE},
}