Antonio L. Alfeo, Mario G. C. A. Cimino. Counterfactual-Based Feature Importance for Explainable Regression of Manufacturing Production Quality Measure. In Modesto Castrillón Santana, Maria De Marsico, Ana L. N. Fred, editors, Proceedings of the 13th International Conference on Pattern Recognition Applications and Methods, ICPRAM 2024, Rome, Italy, February 24-26, 2024. pages 48-56, SCITEPRESS, 2024. [doi]
Abstract is missing.