Energy and Delay Tradeoffs of Soft-Error Masking for 16-nm FinFET Logic Paths: Survey and Impact of Process Variation in the Near-Threshold Region - researchr publication authors

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Faris S. Alghareb, Rizwan Ashraf, Ahmad Alzahrani, Ronald F. DeMara. Energy and Delay Tradeoffs of Soft-Error Masking for 16-nm FinFET Logic Paths: Survey and Impact of Process Variation in the Near-Threshold Region. IEEE Trans. on Circuits and Systems, 64-II(6):695-699, 2017. [doi]

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