External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Energy and Delay Tradeoffs of Soft-Error Masking for 16-nm FinFET Logic Paths: Survey and Impact of Process Variation in the Near-Threshold Region

Faris S. Alghareb, Rizwan Ashraf, Ahmad Alzahrani, Ronald F. DeMara. Energy and Delay Tradeoffs of Soft-Error Masking for 16-nm FinFET Logic Paths: Survey and Impact of Process Variation in the Near-Threshold Region. IEEE Trans. on Circuits and Systems, 64-II(6):695-699, 2017. [doi]

Abstract

Abstract is missing.

runs on