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Rshdee Alhakim, Ghislain Takam Tchendjou, Emmanuel Simeu, Fritz Lebowsky. Image quality assessment using nonlinear learning methods. In 27th International Conference on Microelectronics, ICM 2015, Casablanca, Morocco, December 20-23, 2015. pages 5-8, IEEE, 2015. [doi]

This author has not been identified. Look up 'Rshdee Alhakim' in GoogleThis author has not been identified. Look up 'Ghislain Takam Tchendjou' in GoogleThis author has not been identified. Look up 'Emmanuel Simeu' in GoogleThis author has not been identified. Look up 'Fritz Lebowsky' in Google

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