Rshdee Alhakim, Ghislain Takam Tchendjou, Emmanuel Simeu, Fritz Lebowsky. Image quality assessment using nonlinear learning methods. In 27th International Conference on Microelectronics, ICM 2015, Casablanca, Morocco, December 20-23, 2015. pages 5-8, IEEE, 2015. [doi]
Abstract is missing.