Weak and Strong SRAM cells analysis in embedded memories for PUF applications - researchr publication authors

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A. Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda. Weak and Strong SRAM cells analysis in embedded memories for PUF applications. In XXXIV Conference on Design of Circuits and Integrated Systems, DCIS 2019, Bilbao, Spain, November 20-22, 2019. pages 1-6, IEEE, 2019. [doi]

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