Weak and Strong SRAM cells analysis in embedded memories for PUF applications

A. Alheyasat, Gabriel Torrens, SebastiĆ  A. Bota, Bartomeu Alorda. Weak and Strong SRAM cells analysis in embedded memories for PUF applications. In XXXIV Conference on Design of Circuits and Integrated Systems, DCIS 2019, Bilbao, Spain, November 20-22, 2019. pages 1-6, IEEE, 2019. [doi]

@inproceedings{AlheyasatTBA19,
  title = {Weak and Strong SRAM cells analysis in embedded memories for PUF applications},
  author = {A. Alheyasat and Gabriel Torrens and SebastiĆ  A. Bota and Bartomeu Alorda},
  year = {2019},
  doi = {10.1109/DCIS201949030.2019.8959939},
  url = {https://doi.org/10.1109/DCIS201949030.2019.8959939},
  researchr = {https://researchr.org/publication/AlheyasatTBA19},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {XXXIV Conference on Design of Circuits and Integrated Systems, DCIS 2019, Bilbao, Spain, November 20-22, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-5458-9},
}