Sift-ELM approach for unsupervised change detection in VHR images

Haikel Salem Alhichri. Sift-ELM approach for unsupervised change detection in VHR images. In 2014 IEEE Geoscience and Remote Sensing Symposium, IGARSS 2014, Quebec City, QC, Canada, July 13-18, 2014. pages 4699-4702, IEEE, 2014. [doi]

Abstract

Abstract is missing.