Sk Subidh Ali, Ozgur Sinanoglu, Samah Mohamed Saeed, Ramesh Karri. New scan-based attack using only the test mode. In Martin Margala, Ricardo Augusto da Luz Reis, Alex Orailoglu, Luigi Carro, Luis Miguel Silveira, H. Fatih Ugurdag, editors, 21st IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC 2013, Istanbul, Turkey, October 7-9, 2013. pages 234-239, IEEE, 2013. [doi]
Abstract is missing.