Aser Ashraf Ali, Radwa Essam Taha, Ranpreet Kaur, Shereen Moataz Afifi. Multi-Class Classification of Melanoma on an Edge Device. In International Conference on Microelectronics, ICM 2023, Abu Dhabi, United Arab Emirates, December 17-20, 2023. pages 46-51, IEEE, 2023. [doi]
Abstract is missing.