A Machine Learning Attack-Resilient Strong PUF Leveraging the Process Variation of MRAM

Rashid Ali, Deming Zhang, Hao Cai, Weisheng Zhao, You Wang 0002. A Machine Learning Attack-Resilient Strong PUF Leveraging the Process Variation of MRAM. IEEE Trans. Circuits Syst. II Express Briefs, 69(6):2712-2716, 2022. [doi]

Abstract

Abstract is missing.