Variations in Nanometer CMOS Flip-Flops: Part I - Impact of Process Variations on Timing

Massimo Alioto, Elio Consoli, Gaetano Palumbo. Variations in Nanometer CMOS Flip-Flops: Part I - Impact of Process Variations on Timing. IEEE Trans. on Circuits and Systems, 62-I(8):2035-2043, 2015. [doi]

Authors

Massimo Alioto

This author has not been identified. It may be one of the following persons: Look up 'Massimo Alioto' in Google

Elio Consoli

This author has not been identified. Look up 'Elio Consoli' in Google

Gaetano Palumbo

This author has not been identified. Look up 'Gaetano Palumbo' in Google