Massimo Alioto, David Esseni. Performance and Impact of Process Variations in Tunnel-FET Ultra-Low Voltage Digital Circuits. In Edward David Moreno Ordonez, Rodolfo Jardim de Azevedo, Peter R. Kinget, editors, Proceedings of the 27th Symposium on Integrated Circuits and Systems Design, Aracaju, Brazil, September 1-5, 2014. pages 32, ACM, 2014. [doi]
Abstract is missing.