Massimo Alioto, Gaetano Palumbo, Melita Pennisi. Understanding the Effect of Intradie Random Process Variations in Nanometer Domino Logic. In Lars Svensson, José Monteiro, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 18th International Workshop, PATMOS 2008, Lisbon, Portugal, September 10-12, 2008. Revised Selected Papers. Volume 5349 of Lecture Notes in Computer Science, pages 136-145, Springer, 2008. [doi]
Abstract is missing.