Bijan Alizadeh, Mohammad Mirzaei, Masahiro Fujita. Coverage Driven High-Level Test Generation Using a Polynomial Model of Sequential Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 29(5):737-748, 2010. [doi]
@article{AlizadehMF10,
title = {Coverage Driven High-Level Test Generation Using a Polynomial Model of Sequential Circuits},
author = {Bijan Alizadeh and Mohammad Mirzaei and Masahiro Fujita},
year = {2010},
doi = {10.1109/TCAD.2010.2043571},
url = {http://dx.doi.org/10.1109/TCAD.2010.2043571},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/AlizadehMF10},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {29},
number = {5},
pages = {737-748},
}