Efficient selection of critical paths for delay defects in the presence of process variations

Phaninder Alladi, Spyros Tragoudas. Efficient selection of critical paths for delay defects in the presence of process variations. In 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2016, Istanbul, Turkey, April 12-14, 2016. pages 1-6, IEEE, 2016. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.