Stéphane Allaire, John J. Kim, Stephen L. Breen, David A. Jaffray, Vladimir Pekar. Full orientation invariance and improved feature selectivity of 3D SIFT with application to medical image analysis. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2008, Anchorage, AK, USA, 23-28 June, 2008. pages 1-8, IEEE, 2008. [doi]
@inproceedings{AllaireKBJP08,
title = {Full orientation invariance and improved feature selectivity of 3D SIFT with application to medical image analysis},
author = {Stéphane Allaire and John J. Kim and Stephen L. Breen and David A. Jaffray and Vladimir Pekar},
year = {2008},
doi = {10.1109/CVPRW.2008.4563023},
url = {http://doi.ieeecomputersociety.org/10.1109/CVPRW.2008.4563023},
researchr = {https://researchr.org/publication/AllaireKBJP08},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2008, Anchorage, AK, USA, 23-28 June, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2340-8},
}