John J. Allard. Dynamic Memory Array Card Burn-In and High Speed Functional Card Testing. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 244-248, IEEE Computer Society, 1981.
@inproceedings{Allard81,
title = {Dynamic Memory Array Card Burn-In and High Speed Functional Card Testing},
author = {John J. Allard},
year = {1981},
tags = {testing},
researchr = {https://researchr.org/publication/Allard81},
cites = {0},
citedby = {0},
pages = {244-248},
booktitle = {Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981},
publisher = {IEEE Computer Society},
}