Felipe Almeida, Levent Aksoy, Jaan Raik, Samuel Pagliarini. Side-Channel Attacks on Triple Modular Redundancy Schemes. In 30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021. pages 79-84, IEEE, 2021. [doi]
@inproceedings{AlmeidaARP21,
title = {Side-Channel Attacks on Triple Modular Redundancy Schemes},
author = {Felipe Almeida and Levent Aksoy and Jaan Raik and Samuel Pagliarini},
year = {2021},
doi = {10.1109/ATS52891.2021.00026},
url = {https://doi.org/10.1109/ATS52891.2021.00026},
researchr = {https://researchr.org/publication/AlmeidaARP21},
cites = {0},
citedby = {0},
pages = {79-84},
booktitle = {30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021},
publisher = {IEEE},
isbn = {978-1-6654-4051-6},
}