Omar Alnemer, Helmy Ally, Aamna Alshehhi, M. Saadat, Tewfik Souier, Adel B. Gougam, Hasan Nayfeh. Electrical characteristics of graphene wrinkles extracted by conductive Atomic Force Microscopy and electrical measurements on kelvin structures. In Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE. pages 182-183, IEEE, 2013. [doi]
Abstract is missing.