Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs

Turki Alnuayri, S. Saqib Khursheed, Antonio Leonel Hernández Martínez, Daniele Rossi 0001. Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs. IEEE Trans. VLSI Syst., 29(12):2064-2075, 2021. [doi]

@article{AlnuayriKMR21,
  title = {Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs},
  author = {Turki Alnuayri and S. Saqib Khursheed and Antonio Leonel Hernández Martínez and Daniele Rossi 0001},
  year = {2021},
  doi = {10.1109/TVLSI.2021.3115247},
  url = {https://doi.org/10.1109/TVLSI.2021.3115247},
  researchr = {https://researchr.org/publication/AlnuayriKMR21},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {29},
  number = {12},
  pages = {2064-2075},
}