A Big Data Architecture for Fault Prognostics of Electronic Devices: Application to Power MOSFETs

Carlos J. Alonso-González, Belarmino Pulido, Mario Cartón, Aníbal Bregón. A Big Data Architecture for Fault Prognostics of Electronic Devices: Application to Power MOSFETs. IEEE Access, 7:102160-102173, 2019. [doi]

Abstract

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