B. Alorda, Vicens Canals, Ivan de Paúl, Jaume Segura. A BIST-based Charge Analysis for Embedded Memories. In 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal. pages 199-206, IEEE Computer Society, 2004. [doi]
@inproceedings{AlordaCPS04, title = {A BIST-based Charge Analysis for Embedded Memories}, author = {B. Alorda and Vicens Canals and Ivan de Paúl and Jaume Segura}, year = {2004}, doi = {10.1109/IOLTS.2004.1}, url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.1}, tags = {rule-based, analysis}, researchr = {https://researchr.org/publication/AlordaCPS04}, cites = {0}, citedby = {0}, pages = {199-206}, booktitle = {10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal}, publisher = {IEEE Computer Society}, isbn = {0-7695-2180-0}, }