B. Alorda, Vicens Canals, Ivan de Paúl, Jaume Segura. A BIST-based Charge Analysis for Embedded Memories. In 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 12-14 July 2004, Funchal, Madeira Island, Portugal. pages 199-206, IEEE Computer Society, 2004. [doi]
Abstract is missing.