Exciting Stuck-Open faults in CMOS Circuits Using ILP Techniques - researchr publication authors

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Fadi A. Aloul, Assim Sagahyroon, Bashar Al-Rawi. Exciting Stuck-Open faults in CMOS Circuits Using ILP Techniques. In 2006 IEEE/ACS International Conference on Computer Systems and Applications (AICCSA 2006), March 8-11, Dubai/Sharjah, UAE. pages 409-414, IEEE, 2006. [doi]

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