Fadi A. Aloul, Assim Sagahyroon, Bashar Al-Rawi. Exciting Stuck-Open faults in CMOS Circuits Using ILP Techniques. In 2006 IEEE/ACS International Conference on Computer Systems and Applications (AICCSA 2006), March 8-11, Dubai/Sharjah, UAE. pages 409-414, IEEE, 2006. [doi]
@inproceedings{AloulSR06,
title = {Exciting Stuck-Open faults in CMOS Circuits Using ILP Techniques},
author = {Fadi A. Aloul and Assim Sagahyroon and Bashar Al-Rawi},
year = {2006},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=33913&arnumber=1618388&count=182&index=63},
tags = {source-to-source, open-source},
researchr = {https://researchr.org/publication/AloulSR06},
cites = {0},
citedby = {0},
pages = {409-414},
booktitle = {2006 IEEE/ACS International Conference on Computer Systems and Applications (AICCSA 2006), March 8-11, Dubai/Sharjah, UAE},
publisher = {IEEE},
}