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Slice-Based Cognitive Complexity Metrics for Defect Prediction

Basma S. Alqadi, Jonathan I. Maletic. Slice-Based Cognitive Complexity Metrics for Defect Prediction. In Kostas Kontogiannis, Foutse Khomh, Alexander Chatzigeorgiou, Marios-Eleftherios Fokaefs, Minghui Zhou, editors, 27th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2020, London, ON, Canada, February 18-21, 2020. pages 411-422, IEEE, 2020. [doi]

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Basma S. Alqadi

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Jonathan I. Maletic

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